MODEL RELEASED. Interference microscope. Technician using an interference microscope (surface profiler) to examine a microelectromech- anical system (MEMS). The surface features of the MEMS can be found to a vertical resolution of one tenth of a nanometre using white light interferometry, the pattern caused by the interaction of two waves of white light. MEMS are electrical and mechanical devices with micrometre- sized parts. They include tiny robots (nanorobots), as well as miniature laboratories (labs on a chip) which can be used in sensors or diagnostic devices. Photographed in the Micro- mechanics Lab of Newcastle University, England.